<mets:mets OBJID="oai:generic.eprints.org:186" LABEL="Eprints Item" xsi:schemaLocation="http://www.loc.gov/METS/ http://www.loc.gov/standards/mets/mets.xsd http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-0.xsd" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:mets="http://www.loc.gov/METS/"><mets:metsHdr CREATEDATA="2012-02-09T05:58:51Z"><mets:agent TYPE="ORGANIZATION" ROLE="CUSTODIAN"><mets:name>The MIIS Eprints Archive</mets:name></mets:agent></mets:metsHdr><mets:dmdSec ID="DMD_oai:generic.eprints.org:186_mods"><mets:mdWrap MDTYPE="mods"><mets:xmlData><mods:titleInfo><mods:title>Modelling Quality and Warranty Cost</mods:title></mods:titleInfo><mods:name type="personal"><mods:namePart type="given">Nilima</mods:namePart><mods:namePart type="family">Nigam</mods:namePart><mods:role><mods:roleTerm type="text">author</mods:roleTerm></mods:role></mods:name><mods:abstract>The main aim of this project was to begin a modelling effort directed at optimizing the warranty and quality costs associated with the production of a system with both hardware and software components. This optimization would be constrained by the need to maintain reliability of the product, while staying within an operational budget. Our aim was to identify important quality attributes, and capture overall trends in costs and warranties. </mods:abstract><mods:classification authority="lcc">None/Other</mods:classification><mods:classification authority="lcc">Information and communication technology</mods:classification><mods:originInfo><mods:dateIssued encoding="iso8061">2003</mods:dateIssued></mods:originInfo><mods:genre>Study Group Report</mods:genre></mets:xmlData></mets:mdWrap></mets:dmdSec><mets:amdSec ID="TMD_oai:generic.eprints.org:186"><mets:rightsMD ID="rights_oai:generic.eprints.org:186_mods"><mets:mdWrap MDTYPE="mods"><mets:xmlData><mods:useAndReproduction>
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